Tescan, Czech Republic, introduces the Tescan Clara ultra-high-resolution scanning electron microscope (UHR-SEM), based on Tescan’s BrightBeam technology, which enables variable, filtered BSE detection.
Tescan’s unique Wide Field Optics allows quick location of areas of interest at magnifications as low as 2x before zooming in to understand their makeup. It also offers excellent resolution at low beam energies, making it ideal for imaging beam sensitive and nonconductive samples. Excellent low energy performance also makes it ideal for surface topography measurements.
It is the ideal choice for materials research labs that value not only low kV resolution, but also the ability to select secondary and backscattered electron contrast methods to explore the information that the sample may contain.
While the system’s optics have been designed specifically for imaging, the chamber has been optimized for microanalysis. It has been designed to integrate a large number of analytical detectors and spectrometers, allowing customization of the configuration to suit the specific application, and providing the flexibility to carry out more complex experiments.
Next-generation hardware and precision optics make it an asset for any materials characterization lab or industrial inspection operation. The intuitive and modular user interface can be tailored to the needs of each operator, helping accelerate individual workflows. Setup routines and optimal imaging conditions enable novice users to easily capture high quality images and bring higher end functionalities well within their reach.
