May 2023 Issue of Electronic Device Failure Analysis, a quarterly publication providing a technical condensation of information of interest to electronic device failure analysis technicians, engineers, and managers.
Charged ions melt nano gold nuggets
In experiments conducted at TU Wien, Vienna, extremely small pieces of gold, consisting of a few thousand atoms and with a diameter in the order of ten nanometers, are bombarded with highly charged ions. This makes it possible to change the shape and size of these gold pieces in a targeted manner. The effects of the ion bombardment were then studied in an atomic force microscope with surprising results.
Graphene grows—and we can see it
Graphene is extremely strong and good at conducting heat and electrical currents, making it an exceptionally versatile material. Yet, many properties of the material are still poorly understood – for the simple reason that the atoms they are made up of are very difficult to observe. A team of researchers from the University of Amsterdam (UvA) and New York University have now found a surprising way to solve this issue.
Energy Sciences Center Tour: Film Growth Lab
Take a look inside the film growth lab in Pacific Northwest National Laboratory’s Energy Sciences Center where researchers are growing highly controlled thin films to study energy storage, quantum phenomena, and energy conversion reactions.
Georgia Tech and GlobalFoundries to collaborate on joint semiconductor research and workforce development
Georgia Institute of Technology, Atlanta, one of the top public research universities in the U.S., and GlobalFoundries, Malta, NY., one of the world’s leading semiconductor manufacturers, announced a new partnership to expand collaboration on semiconductor research, education, talent, and workforce development.



