Lasertec, Japan, introduces its Optelics Hybrid microscope, which combines a confocal scanning laser microscope with a full color confocal microscope.
Hybrid microscope combines confocal-scanning-laser and full-color-confocal microscopes
Hybrid microscope combines confocal-scanning-laser and full-color-confocal microscopes
Lasertec, Japan, introduces its Optelics Hybrid microscope, which combines a confocal scanning laser microscope with a full color confocal microscope.
Oxford Instruments Asylum Research opens AFM demo lab in Mumbai
Oxford Instruments Asylum Research, Santa Barbara, Calif., announces the opening of its first Nanotechnology Lab for Atomic Force Microscopy (AFM) in Mumbai, India.
ClassOne electroplating tool designed for 100 to 200-mm substrates
ClassOne Technology, Kalispell, Mont., has launched its Solstice line of electroplating tools designed specifically for 100 to 200-mm substrates.
SUSS MicroTec launches ELD 300 excimer laser debonder for 3D integration
SÜSS MicroTec, Germany, has launched an excimer laser debonder, the ELD300, for the stress-free debonding of 200 and 300-mm 3D-IC wafers.