Shimadzu Scientific Instruments, Japan, announces the release of its new Hyper Vision HPV-X2 high-speed video camera.
Silicon drift detectors with silicon nitride entry window enable 35% higher sensitivity
Edax Inc., Mahwah, N.J., introduces a new series of Octane Elite silicon drift detectors with silicon nitride entry windows that offer up to 35% better light-element sensitivity and outstanding low-energy performance.
Silicon drift detectors with silicon nitride entry window enable fast energy dispersive spectroscopy
Jeol introduces third-generation Neoscope SEM with upgraded functionality
Hitachi TEM is now compatible with imaging software from Advanced Microscopy Techniques
Hitachi High Technologies America Inc., Clarksburg, Md., announces that Hitachi, the University of Colorado at Boulder, and the TEM camera manufacturer Advanced Microscopy Techniques (AMT) of Woburn, Mass., have collaborated to develop a convenient software package for state-of-the-art, single or dual-axis tomography acquisition and extended image montaging for the Hitachi HT7700 TEM.





