Buehler, Lake Bluff, Ill., introduces two universal hardness testers: the Wilson VH1102 and VH1202, both equipped with the extensively upgraded version of its DiaMet software.
The IMS Education Committee, chaired by Laura Moyer, recently sent out a survey to members to assess education/training needs.
FEI Co., Hillsboro, Ore., released the new Themis Z scanning/transmission electron microscope (S/TEM), an automated STEM that offers the industry leading specifications for image resolution, analytical speed and quality, and light element imaging sensitivity.
This new profile series introduces leading materials scientists from around the world who happen to be females. Here we speak with Amber N. Black, an applications engineer for PTR – Precision Technologies Inc.
August 2016 Issue of Electronic Device Failure Analysis, a quarterly publication providing a technical condensation of information of interest to electronic device failure analysis technicians, engineers, and managers.
