Buehler, Lake Bluff., Ill., introduces the Wilson VH3300 Vickers/Knoop hardness test system, which expands the range of automatic Vickers/Knoop hardness testers with a solution tailored to measurements with very high and/or very low test loads.
Keough to Present AFS Honorary Lecture
John R. (Chip) Keough, FASM, of Applied Process Inc., Ann Arbor, Mich., was selected by the American Foundry Society (AFS) to present the Cast Iron Division Honorary Lecture at its upcoming Metalcasting Congress in April.
Nikon inspection and analysis software enables four times better resolution
Nikon Metrology, Brighton, Mich., introduces Inspect-X 5.0, which supports a new 16M-pixel flat panel detector that enables four times better resolution for CT scans.
Helios G4 HX designed for advanced semiconductor failure analysis labs
FEI Co., Hillsboro, Oregon, announces that the new Helios G4 HX utilizes a patented inverted TEM sample preparation method to create high-quality lamellas for the most advanced semiconductor nodes.
Olympus LED-illuminated microscope plus image analysis software simplify workflow
Olympus Corp., Tokyo, introduces the Olympus BX53M system microscope and Olympus Stream 2.1 image analysis software that together simplify workflow from observation to measurement, analysis, and reporting.