Engineering researchers at the University of Arkansas in Fayetteville have developed an infrared detector made of thin films of GeSn semiconductor material deposited on a silicon substrate.
FEI Co., Hillsboro, Ore., announces the opening of a new technology center in the industrial estate of Cernovická Terasa, Brno, Czech Republic.
Nordson DAGE, Aylsworth, U.K., a division of Nordson Corp., announces the launch of its Xi3400 Automated X-ray Inspection System (AXI).
A-STAR, Singapore, announces that four joint laboratories, representing a commitment of $160 million between private and public sectors, were launched this summer between the Agency for Science, Technology and Research’s (A*STAR’s) Institute of Microelectronics, and its ten industry partners.
Advantech US Inc., Pittsburgh, reports that its engineers working with Penn State’s Nanofabrication Laboratory have fabricated a prototype mask of silicon etched with the required micrometer-scale features.
