Oxford Instruments, Concord, Mass., introduces a real-time navigation and imaging system for the SEM that helps users interactively explore samples based on video-rate X-ray maps colored by element rather than the black and white electron image alone.
Hitachi High-Technologies Corp., Tokyo, announces the development of an all-new high-performance Ethos FIB-SEM based on a newly developed magnetic/electrostatic compound lens that enables it to deliver advanced imaging performance resolving sub-nanometer features in high contrast for low-voltage SEM applications.
Jeol USA, Peabody, Mass., introduces the newest addition to the Jeol InTouchScope series SEMs, the JSM-IT500HR, which features a high-brightness, long-life emitter with stable probe current.
Coventor Inc., Cary, N.C., announces the availability of SEMulator3D 6.1, the latest version of its semiconductor virtual fabrication platform.
Micron Technology Inc., Boise, Idaho, has opened a new facility that will nearly double the cleanroom space dedicated to research and development, and will support a significant expansion of the company’s overall R&D capabilities.
