Edax Inc., Mahwah, N.J., has launched the XLNCE SMX-BEN, the first in a series of new XRF analyzers for rapid, nondestructive coating thickness and composition analysis.
Edax launches new XRF analyzers for coating thickness and composition analysis
TSMC certifies Mentor Graphics tools for TSMC 10nm FinFET Technology
Mentor Graphics Corp., Wilsonville, Ore., announces that TSMC and Mentor Graphics have reached the first milestone of their collaboration on 10nm EDA certification.
Multi-sensor microscope optical head enables multiple FA techniques
Quantum Focus Instrument Corp., Vista, Calif., introduces QuantumScope, a multi-sensor microscope optical head in which mid-wavelength infrared hot-spot detection, photoemission, and laser signal injection microscopy techniques are integrated into the same optical inspection platform.
Eutectic gallium-indium nanoparticles developed for inkjet printing of electronic circuits
Purdue University, West Lafayette, Ind., reports that researchers have developed eutectic gallium-indium nanoparticles coated with Ga2O3 or thiol and suspended in ethanol for inkjet printing of electronic circuits.
Flir Systems launches three science-grade cooled thermal cameras
Flir Systems, Freeport, Pa., has launched three science-grade thermal cameras: the A6200sc NIR, A8300sc HD MWIR, and A6700sc LWIR.