Edax Inc., Mahwah, N.J., has launched the XLNCE SMX-BEN, the first in a series of new XRF analyzers for rapid, nondestructive coating thickness and composition analysis. It is a metrology tool for process development and quality control. It is capable of quickly and easily analyzing both multi-layered and single-layered substrates containing up to 30 elements, with layers ranging from less than a nanometer to microns in thickness.
Typical measurement applications include metal coating analysis, Mo, Cd, Te, and Se thickness measurements in all CIGS PV combinations, as well as CdS and related buffer layers. It is an excellent choice for R&D, process development, and failure analysis, facilitating material selection and recipe formulation in a pre- or early production ramp phase and guaranteeing complete process control from R&D to manufacturing.
Areas of application include photovoltaic, manufacturing, protective coatings, metallic layer measurements, corrosion/wear and thermal barrier analysis.
