Nikon Metrology, Brighton, Mich., introduces Inspect-X 5.0, which supports a new 16M-pixel flat panel detector that enables four times better resolution for CT scans.
Nikon inspection and analysis software enables four times better resolution
Helios G4 HX designed for advanced semiconductor failure analysis labs
FEI Co., Hillsboro, Oregon, announces that the new Helios G4 HX utilizes a patented inverted TEM sample preparation method to create high-quality lamellas for the most advanced semiconductor nodes.
Olympus LED-illuminated microscope plus image analysis software simplify workflow
Olympus Corp., Tokyo, introduces the Olympus BX53M system microscope and Olympus Stream 2.1 image analysis software that together simplify workflow from observation to measurement, analysis, and reporting.
One Minute Mentor: Tempering Tool Steels
As shown in the graph for an M2 steel austenitized at 2225°F, the hardness of high-speed steel is directly affected by tempering temperature and time.
NASA’s Wide-Field Telescope of the Future
NASA officially is beginning work on an astrophysics mission designed to help unlock the secrets of the universe—the Wide Field Infrared Survey Telescope (WFIRST).