Federal agencies would be prohibited from using certain products if they were purchased from an entity other than the original manufacturer or an authorized reseller under a new bipartisan Senate bill.
NEOTech, Chatsworth, Calif., a leading provider of electronic manufacturing services, design engineering, and supply chain solutions in the high-tech industrial, medical device, and aerospace/defense markets, announced a significant investment in and acquisition of state-of-the-art three-dimensional Computed Tomography scan equipment for its engineering laboratory.
A new computer vision technique developed by MIT engineers significantly speeds up the characterization of newly synthesized electronic materials.
An improved technique for analyzing single-atom defect structures and minor electron behavior disturbance in semiconductor and other materials has been demonstrated by researchers from the University of Tsukuba in Japan using time-resolved atomic force microscopy combed with ultra-short laser pulse technology.
New research at the University of Kansas partially explains the exceptional performance of a new class of organic semiconductors called non-fullerene acceptors.
