A new computer vision technique developed by MIT engineers significantly speeds up the characterization of newly synthesized electronic materials.
An improved technique for analyzing single-atom defect structures and minor electron behavior disturbance in semiconductor and other materials has been demonstrated by researchers from the University of Tsukuba in Japan using time-resolved atomic force microscopy combed with ultra-short laser pulse technology.
New research at the University of Kansas partially explains the exceptional performance of a new class of organic semiconductors called non-fullerene acceptors.
Applied Materials, Inc., Santa Clara, Calif., introduced materials engineering innovations designed to increase the performance-per-watt of computer systems by enabling copper wiring to scale to the 2nm logic node and beyond.
The July/August 2024 issue of Advanced Materials & Processes magazine has an editorial focus on Green Materials Engineering.
