ACE Solution, Taiwan, the leader and the provider in customized test solutions to meet customer needs in electrical components, devices and system manufactures, launched the TZ6000 – a nondestructive wafer quality measurement tool for the compound semiconductor industry. Incorporated with TeraPulse Lx technologies from TeraView, United Kingdom, the TZ6000 achieves nondestructive wafer quality measurements of […]
JEOL introduces new FIB-SEM for fast, atomic resolution STEM sample preparation
JEOL, Peabody, Mass., developed a new Focused Ion Beam (FIB) solution for preparing specimens prior to observing them in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The new FIB sample stage offers fast […]
FormFactor opens Silicon Valley Demo Center
FormFactor, Inc., Livermore, Calif., a leading semiconductor test and measurement supplier, opened a new product demonstration and training center in San Jose, California. The facility is staffed with applications engineers and training professionals, and features FormFactor engineering wafer probers, metrology systems and advanced probe cards outfitted to meet semiconductor test and measurement requirements from lab […]
Perovskites, a ‘dirt cheap’ alternative to silicon, just got a lot more efficient
A study at the University of Rochester, Rochester, N.Y., suggests perovskites — a family of materials nicknamed for their crystalline structure that have shown extraordinary promise in recent years as a far less expensive, equally efficient replacement for silicon in solar cells and detectors — may become far more efficient. Researchers typically synthesize perovskites in […]
Argonne scientists develop new X-ray data reconstruction method
Scientists at the Argonne National Laboratory Advanced Photon Source (APS), Lemont, Ill., are exploring ways to analyze X-ray data faster and with more precision; its new TomocuPy software package has shown to be up to 30 times faster than the current practice. Collecting and processing X-ray data faster is especially important for scientists working at […]