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Home Search results for: -/journal_content/56/10192/39892774/PUBLICATION

NXP Semiconductors to participate in SRC research initiatives

Semiconductor Research Corporation (SRC), Durham, N.C., announces that NXP Semiconductors, Netherlands, has signed an agreement to participate in multiple SRC research initiatives.

Optotherm infrared camera based on amorphous silicon microbolometer technology

Optotherm, Sewickley, Pa., recently developed the IS640 radiometric infrared camera designed for thermographic applications requiring high sensitivity, resolution, and accuracy.

Bruker Tracer 5i handheld XRF analyzer features powerful tube and detector

Bruker Corp., Kennewick, Wash., introduces the Tracer 5i handheld X-ray fluorescence (XRF) elemental analyzer, which is more sensitive, flexible, and field interactive than the previous model, while retaining its unique advantages and comprehensive analytical software.

Shimadzu infrared microscope enables high-sensitivity analysis of electronic devices

Shimadzu Scientific Instruments (SSI), Japan, announces the release of the AIM-9000 infrared microscope with automated analysis functions and an enhanced wide field camera option.

Global Foundries to invest over $2 billion to produce 7nm computer chips

Global Foundries, Santa Clara, Calif., says it will invest more than $2 billion at its Fab 8 facility in Malta, in upper New York state, to produce cutting-edge 7nm computer chips that will offer high performance for the next era of computing applications.

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