John R. (Chip) Keough, FASM, of Applied Process Inc., Ann Arbor, Mich., was selected by the American Foundry Society (AFS) to present the Cast Iron Division Honorary Lecture at its upcoming Metalcasting Congress in April.
Nikon Metrology, Brighton, Mich., introduces Inspect-X 5.0, which supports a new 16M-pixel flat panel detector that enables four times better resolution for CT scans.
FEI Co., Hillsboro, Oregon, announces that the new Helios G4 HX utilizes a patented inverted TEM sample preparation method to create high-quality lamellas for the most advanced semiconductor nodes.
Olympus Corp., Tokyo, introduces the Olympus BX53M system microscope and Olympus Stream 2.1 image analysis software that together simplify workflow from observation to measurement, analysis, and reporting.
As shown in the graph for an M2 steel austenitized at 2225°F, the hardness of high-speed steel is directly affected by tempering temperature and time.
