Brewer Science, Rolla, Mo., announces the completion of its largest expansion in the Springfield area, with the company gaining additional floor space at the Missouri State University’s Roy Blunt Jordan Valley Innovation Center.
Tescan introduces FIB-SEM workstation with 1.5 nm resolution, integrated Raman system
Tescan, Warrendale, Pa., introduces the new GAIA3 FIB-SEM workstation, which builds on the success of the Tescan Lyra FIB-SEM workstation.
Shimadzu EDXRF receives award for Analytical Instrument Industrial Design
Shimadzu North America, Columbia, Md., announces that its EDX-7000/8000 energy-dispersive X-ray fluorescence spectrometers won the 2014 IBO Gold Award for Analytical Instrument Industrial Design.
Jeol benchtop EDXRF provides elemental analysis with little or no sample prep
Jeol USA, Peabody, Mass., introduces the JSX-1000S ElementEye, an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer.
Software enables microspectrophotometers to make fast measurements of thin films
Craic Technologies, San Dimas, Calif., introduces Craic FilmPro film thickness measurement software.