Veeco Instruments Inc., Plainview, N.Y., reports that its new Odyssey ion beam deposition (IBD) upgrade for the NEXUS IBD-LDD system has repeatedly produced photomask blanks with zero deposition defects larger than 70 nanometers.
Engineering researchers at the University of Arkansas in Fayetteville have developed an infrared detector made of thin films of GeSn semiconductor material deposited on a silicon substrate.
FEI Co., Hillsboro, Ore., announces the opening of a new technology center in the industrial estate of Cernovická Terasa, Brno, Czech Republic.
Nordson DAGE, Aylsworth, U.K., a division of Nordson Corp., announces the launch of its Xi3400 Automated X-ray Inspection System (AXI).
A-STAR, Singapore, announces that four joint laboratories, representing a commitment of $160 million between private and public sectors, were launched this summer between the Agency for Science, Technology and Research’s (A*STAR’s) Institute of Microelectronics, and its ten industry partners.
