Quantum Focus Instruments, Vista, Calif., announces that Innovative Circuits Engineering, a Silicon Valley integrated circuit test services business, has expanded its semiconductor failure analysis offerings through the acquisition of a QuantumScope failure analysis microscope.
The QuantumScope design includes a unique multi-sensor optical head, which has mid-wavelength infrared (MWIR) hot spot detection, photoemission, and laser signal injection microscopy (LSIM) techniques integrated to the same optical inspection platform. ICE engineers are now able to investigate semiconductor devices with all three primary optical FA techniques without moving between systems or changing set-up conditions. This multi-sensor optical head design greatly enhances device throughput and defect capture rates.
Semiconductor FA engineers generally talk of their investigation work in terms of seeking the root cause of failures on a DUT (device under test). Failure conditions often mimic operation of the DUT in real world applications. It can be a frustrating process for the engineer facing a DUT that has an elusive or intermittent defect. When an engineer is able to coax such a recalcitrant DUT into exhibiting the defect state under investigation, it becomes a race to determine the defect mechanisms involved before being forced to move the DUT to another type of inspection tool and start the investigation process all over.
The multi-sensor optical head of the QuantumScope leverages an engineer’s time by allowing inspection of the DUT with multiple FA techniques on the same system, without moving the device or altering electrical biasing conditions. ICE engineers expect this approach of multiple FA techniques in a single system will lead directly to faster turnaround for customers in ICE’s primary test services market in Silicon Valley.
