Oxford Instruments Asylum Research, Santa Barbara, Calif., announces the new Jupiter XR Atomic Force Microscope, the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.
Jupiter XR features a fully-addressable 200 mm sample chuck, and simple and intuitive software control of system setup. This includes laser and detector alignment, automated optimization of imaging parameters, automated multi-site imaging and analysis, and Asylum Research’s unique blueDrive tapping mode for improved tip lifetime and measurement repeatability.
It is also the world’s most versatile large-sample AFM, incorporating Asylum Research’s extraordinary range of capabilities and accessories, and a modular design that supports future expansion. It works well in research environments, high-throughput industrial applications, and failure analysis labs. No matter the application, this large-stage AFM provides ease of use, speed, performance, and flexibility.
https://afm.oxinst.com/products/jupiter-family-of-afms/jupiter-xr-afm
