Bruker, Billerica, Mass., introduces the Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system, which is built around Bruker’s TriboScope capacitive transducer technology. It delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
Supporting the most prominent testing modes, the TS Select is an affordable entry into quantitative nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and high-resolution mechanical property mapping.
Bruker’s in-situ scanning probe microscopy (SPM) utilizes the same probe to raster the sample surface for topography imaging as it does to conduct the nanomechanical test. This ability to visualize the sample surface on the same length scale as the testing delivers superior nanomechanical characterization results and data reliability. In-situ SPM imaging enables nanometer precision test placement accuracy, to ensure that the test is at the exact desired location.
Bruker’s TS Select control and analysis software package was specifically developed to simplify the measurement process; from loading samples and test set-up to measurement execution and data analysis. TS Select control software incorporates automated sample testing and instrument calibration routines for simple, high throughput, and mistake-free characterization.
