Chip Targets, Richardson, Texas, announces that it has increased its range of failure analysis service capabilities to include an atmospheric microwave induced plasma (MIP) decapsulation instrument from Jiaco Instruments of Delft, the Netherlands. It is the first failure analysis lab in the United States to offer this service.
Automated atmospheric pressure MIP decapsulation utilizes only oxygen and patent-pending hydrogen-based recipes. The system has been proven for copper, palladium-copper, gold, and silver bond wires; and for advanced package types such as 3D, SiP, WLCSP, High Tg, Chip on Board, and BOAC. MIP decapsulation has been successful without process-induced damage, enabling reliable failure analysis and reliability testing.
With this technology, Chip Targets can now provide state-of-the art decapsulation services and high-quality analysis to its extensive customer base, which includes both large and small semiconductor manufacturing companies, fabless semiconductor companies, defense contractors, nanotechnology companies, and reverse engineering firms.
