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1458 items found
Gatan introduces the Metro in-situ counting camera for microscopy imaging below 200 kV
Published: August 18, 2022
Ametek Gatan Inc., Pleasanton, Calif., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, launched the Metro, a cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ transmission electron microscopy below 200 kV.
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World’s fastest Q-TOF mass spectrometer released, capable of simultaneously measuring positive and negative ions
Published: August 11, 2022
Shimadzu has released the LCMS-9050 quadrupole time-of-flight high-performance liquid chromatograph mass spectrometer, increasing the amount of information obtained from each sample and data reliability in a short analysis time.
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Hitachi High-Tech develops the service of remote degradation diagnostic systems for on-board automotive lithium-ion batteries
Published: August 11, 2022
Hitachi High-Tech Corp., Japan, announced the development of a remote service to diagnose the degradation status for on-board automotive lithium-ion batteries.
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Human vs machines: hardness testing with the AMH55
Published: August 11, 2022
Leco, St. Joseph, Mich., pit seven humans of varying metallographic experience against the AMH55, its cornerstone automated hardness testing software to see if it really provides that much of an advantage over manual methods.
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UAH-developed ultrasensitive optical sensing instrument has broad medical, science uses
Published: August 11, 2022
In research that could broadly benefit science, medicine, and engineering, a new kind of ultrasensitive optical sensing instrument has been developed by a doctoral student at the University of Alabama in Huntsville.
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Counterfeit chips a problem as global shortage increases semiconductor fraud
Published: July 20, 2022
According to ERAI Inc., Naples, Fla., the world’s leader in counterfeit electronics databases, 2021 saw record wire-fraud cases reported by desperate buyers.
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New Cypher L atomic force microscope provides higher resolution and a simpler user experience for core nanoscience research fields
Published: July 20, 2022
Oxford Instruments Asylum Research, Santa Barbara, Calif., launched its new Cypher L atomic force microscope, designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage.
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Institute for Factory Automation and Production Systems installs Tescan Amber X Plasma FIB-SEM for diverse set of materials research projects
Published: July 20, 2022
Tescan Orsay Holding a.s., Czech Republic, announces the installation of the Amber X focused ion beam-scanning electron microscope at the Institute for Factory Automation and Production Systems in Germany.
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New metrological technique uses stress for nanotomography
Published: July 20, 2022
Researchers from the Skolkovo Institute of Science and Technology (Skoltech) and their colleagues in Russia and Spain demonstrated proof-of-concept of a new radiation-safe method for mapping the internal structure and stress distribution in samples of materials at the nanoscale, with a resolution about 100 times higher than that of the x-ray and neutron tomography techniques currently available.
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NSF award will help UAB researchers develop and understand high-temperature-resistant materials
Published: July 20, 2022
Shane Aaron Catledge, Ph.D., associate professor in the University of Alabama at Birmingham Department of Physics, was awarded a three-year Division of Materials grant from the National Science Foundation for his project “New frontiers in synthesis of high-entropy transition metal borides enabled by microwave-induced plasma.”
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