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1458 items found
SEMI forms Technology Communities to speed industry collaboration and innovation
Published: February 24, 2018
SEMI, Milpitas, Calif., announces a new group called Technology Communities, to better collaborate, align, and enhance all of SEMI’s technology-focused activities by operating them under one umbrella.
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Annual semiconductor sales increase 21.6%, top $400 billion for first time
Published: February 24, 2018
The Semiconductor Industry Association (SIA), Washington, announces that the global semiconductor industry posted sales totaling $412.2 billion in 2017, the industry’s highest-ever annual sales and an increase of 21.6 percent compared to the 2016 total.
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Akhan Semiconductor deploys 200mm process in new diamond-based chip facility
Published: February 24, 2018
Akhan Semiconductor, Gurnee, Ill., a developer of diamond semiconductor technology, announces that it is deploying 200mm manufacturing equipment and process in its new production facility in Gurnee.
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Brewer Science launches Sensor System Solutions for customized sensor development
Published: February 24, 2018
Brewer Science Inc., Monterey, Calif., launches its Sensor System Solutions program, which provides full consulting services to support customers from design through integration, to achieve complete, high-performance electronic systems.
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Cadence and Advanced Semiconductor develop SIP-EDA solution for multi-die packages
Published: February 24, 2018
Advanced Semiconductor Engineering Inc., Taiwan, and Cadence Design Systems Inc., San Jose, Calif., announce that they have collaborated to release a System-in-Package (SiP) EDA solution that addresses the challenges of designing and verifying Fan-Out Chip-on-substrate multi-die packages.
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Craic adds Raman microspectroscopy to its 20/30 PV microspectrophotometer
Published: February 24, 2018
Craic Technologies, San Dimas, Calif., has added Raman microspectroscopy to its 20/30 Perfect Vision microspectrophotometer.
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MIX microscope observation method combines darkfield with brightfield to detect flaws
Published: February 24, 2018
Olympus, Japan, has developed the MX63/MX63L microscopes, which provide MIX observation technology that produces unique observation images by combining darkfield with another observation method, such as brightfield, fluorescence, or polarization.
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Edax launches new revision of Apex software for energy dispersive spectroscopy systems
Published: February 24, 2018
Edax Inc., Mahwah, N.J., introduces the latest revision of its Apex analysis software, which was developed to ensure high-quality results that accelerate and simplify compositional analysis.
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Jeol InTouchScope SEM provides long-life emitter and resolution of 1.5nm at 30kV
Published: February 24, 2018
Jeol USA, Peabody, Mass., offers the JSM-IT500HR InTouchScope, a scanning electron microscope that is said to deliver high-resolution field emission SEM performance with the ease of operation of Jeol’s Tungsten SEMs.
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Global Foundries delivers 45nm RF SOI prototypes for advanced 5G applications
Published: February 23, 2018
Global Foundries, Santa Clara, Calif., announces that its 45nm RF SOI (45RFSOI) technology platform has been qualified and is ready for volume production.
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