Brewer Science expands research for carbon-base materials at Missouri State

Published: October 20, 2014

Brewer Science, Rolla, Mo., announces the completion of its largest expansion in the Springfield area, with the company gaining additional floor space at the Missouri State University's Roy Blunt Jordan Valley Innovation Center.

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Tescan introduces FIB-SEM workstation with 1.5 nm resolution, integrated Raman system

Published: October 20, 2014

Tescan, Warrendale, Pa., introduces the new GAIA3 FIB-SEM workstation, which builds on the success of the Tescan Lyra FIB-SEM workstation.

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Shimadzu EDXRF receives award for Analytical Instrument Industrial Design

Published: October 20, 2014

Shimadzu North America, Columbia, Md., announces that its EDX-7000/8000 energy-dispersive X-ray fluorescence spectrometers won the 2014 IBO Gold Award for Analytical Instrument Industrial Design.

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Jeol benchtop EDXRF provides elemental analysis with little or no sample prep

Published: October 20, 2014

Jeol USA, Peabody, Mass., introduces the JSX-1000S ElementEye, an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer.

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Software enables microspectrophotometers to make fast measurements of thin films

Published: October 20, 2014

Craic Technologies, San Dimas, Calif., introduces Craic FilmPro film thickness measurement software.

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DCG Systems Meridian probe enables full wafer diagnostic and testing under production conditions

Published: October 19, 2014

DCG Systems Inc., Fremont, Calif., announces the first installation of the Meridian WS-DP (WaferScan Direct Probe) at Nvidia, a leading manufacturer of graphics processors for advanced visual computing.

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Element Six thermal grade of diamond offers full isotropic heat spreading

Published: October 19, 2014

Element Six, a member of the De Beers Group of companies, announces a new thermal grade of diamond grown by chemical vapor deposition, DiaFilm TM130.

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Nanotronics Imaging nSPEC 3D microscope captures nanoscale images

Published: October 19, 2014

Nanotronics Imaging, Cuyahoga Falls, Ohio, introduces its latest computer-controlled microscope, the nSPEC 3D, which combines high quality and imaging purity of optical lenses with advanced computer pattern-recognition algorithms and custom 3D printed hardware.

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Electron-beam melting builds nickel-base parts with precise microstructures

Published: October 19, 2014

Researchers at Oak Ridge National Laboratory, Oak Ridge, Tenn., have demonstrated that building parts by electron beam melting enables control of the microstructure and properties of metal components with high precision.

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ASM International partners with AQM to offer classes overseas

Published: October 02, 2014

Fall metallurgical class schedule available for new Italy location

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