Algorithm could shorten quality testing and research in many industries by months

Published: March 16, 2022

A machine-learning algorithm developed at Sandia National Laboratories, Albuquerque, N.M., could provide auto manufacturing, aerospace and other industries a faster and more cost-efficient way to test bulk materials.

News, Magazine & Media / Industry News

Covalent Metrology’s Failure Analysis Group delivers enhanced x-ray inspection services

Published: March 16, 2022

Covalent Metrology, Sunnyvale, Calif., announced the newly installed Quadra 7 x-ray inspection system, which achieves spatial resolution down to 100 nanometers and delivers 4K-level detail for subsurface imaging.

News, Magazine & Media / Industry News

FormFactor launches new high-power semiconductor wafer probing system for automotive, renewable energy, and industrial applications

Published: March 16, 2022

FormFactor, Livermore, Calif, launched the TESLA300 high-power semiconductor probing system designed specifically for IGBT and power MOSFET device measurements on 300mm wafers.

News, Magazine & Media / Industry News

JEOL introduces its next generation NMR spectrometers: The ECZ Luminous series

Published: March 16, 2022

JEOL USA, Peabody, Mass., announced the next generation of JEOL NMR spectrometers: the ECZ Luminous series. This product is a next step in spectrometer miniaturization and improving performance through state-of-the-art digital and high-frequency technologies.

News, Magazine & Media / Industry News

Crystallography for misfit crystals

Published: February 16, 2022

A team of scientists at Lawrence Berkeley National Laboratory, Berkeley, Calif., is providing a better way for scientists to study the structures of the many materials that don’t form tidy single crystals, such as solar absorbers and metal-organic frameworks, with advanced algorithms and an exceptional x-ray.

News, Magazine & Media / Industry News

Resurrecting and improving a technique for detecting transistor defects

Published: February 16, 2022

Researchers at the National Institute of Standards and Technology, Gaithersburg, Md, have revived and improved a once-reliable technique to identify and count defects in transistors, the building blocks of modern electronic devices such as smartphones and computers.

News, Magazine & Media / Industry News

Contamination disrupts flash chip output at two Japan plants

Published: February 16, 2022

Operations at two Japanese factories producing flash memory chips have been disrupted by the contamination of industrial materials, chipmaker Kioxia said, as analysts warned of potential price hikes for the key smartphone components.

News, Magazine & Media / Industry News

Bruker introduces Connexus: a NMR capacity sharing cloud-based platform for collaboration between scientists and analytical labs in Europe

Published: February 16, 2022

Bruker BioSpin, Switzerland, introduced Connexus in Europe – a cloud-based collaboration platform that connects nuclear magnetic resonance scientists in need of analytical services and data evaluation expertise with NMR laboratories with available capabilities.

News, Magazine & Media / Industry News

Analysis and containment of defect formation in zinc phosphide crystals: a nanoscale approach

Published: February 16, 2022

Researchers at the Catalan Institute of Nanoscience and Nanotechnology, Spain, and the Ecole Polytechnique Fédérale of Switzerland, fabricated high-quality zinc phosphide crystals free of interface defects with a nanoscale approach.

News, Magazine & Media / Industry News

EDAX introduces the Clarity Super EBSD analysis system

Published: February 16, 2022

EDAX LLC, Mahwah, N.J., a leader in x-ray microanalysis and electron diffraction instrumentation, has added the Clarity Super to its electron backscatter diffraction product line.

News, Magazine & Media / Industry News