Industry News
Keep up-to-date on the latest advances in the metals and materials industry with ASM Industry News.
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1282 items found
Laser FIB on Zeiss Crossbeam 350/550 enables access to deeply buried structures
Published: April 17, 2020
Zeiss, Germany, announces that researchers who perform multi-scale, correlative studies using X-ray microscopy data to drive FIB-SEM site selections, today can further enhance their workflows: the newly introduced, patented LaserFIB on Zeiss Crossbeam 350/550 enables the access of deeply buried structures in addition to rapid, gallium free structure fabrication over large length scales.
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Nikon super-resolution structured illumination doubles resolution of widefield microscope
Published: April 17, 2020
Nikon Instruments, Melville, N.Y., describes super-resolution structured illumination microscopy (SIM) as a revolutionary imaging technique for doubling the resolution of a widefield microscope in 3D. It is a user-friendly super-resolution technology easily applied to a variety of sample types.
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Global semiconductor sales in February down 2.4% from January, up 5% from 2019
Published: April 17, 2020
The Semiconductor Industry Association (SIA), Washington, reports that worldwide sales of semiconductors were $34.5 billion for the month of February 2020, a decrease of 2.4 percent from the January 2020 total of $35.4 billion, but a jump of 5.0 percent compared to the February 2019 total of $32.9 billion.
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Jeol acquires IDES to enable TEM image capture in nanoseconds and femtoseconds
Published: April 17, 2020
Jeol Ltd., Peabody, Mass., recently acquired all shares of Integrated Dynamic Electron Solutions Inc. (IDES), an entrepreneurial venture specializing in technologies related to transmission electron microscopy, and made the company its wholly owned subsidiary.
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Oxford Instruments partners with Direct Electron for its TEM direct detection cameras
Published: April 17, 2020
Oxford Instruments plc, England, announces that its NanoAnalysis division has recently partnered with U.S.-based Direct Electron, which produces next-generation direct detection cameras for transmission electron microscopes
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Bruker HighSense enables EDXRF spectrometers to detect elements in ppm concentrations
Published: April 17, 2020
Bruker, Billerica, Mass., introduces the S2 PUMA Series 2 spectrometer with HighSense Technology, the high-end Energy-Dispersive X-ray Fluorescence (EDXRF) spectrometer for elemental analysis.
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Thermo Fisher Scientific diagnostic test for COVID-19 receives emergency approval
Published: April 03, 2020
Thermo Fisher Scientific Inc., Waltham, Mass., announces that on March 13 the U.S. Food and Drug Administration issued an emergency use authorization (EUA) for its diagnostic test that can be used immediately by CLIA high-complexity laboratories in the United States to detect nucleic acid from SARS-CoV-2, the virus that causes COVID-19, and not for any other viruses or pathogens.
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Connect with ASM colleagues to share resources, post events, discuss ideas and issues
Published: March 27, 2020
ASM CONNECT launched for all ASM members on January 15; since then, over 100 posts/replies have been discussed.
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Samsung begins production at its fabrication line for EUV lithography semiconductor chips
Published: March 18, 2020
Samsung Electronics, Korea, announces that mass production has begun at its new cutting-edge semiconductor fabrication line in Hwaseong, Korea, to produce chips using a process node of 7 nanometers and below.
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Nikon Metrology develops x-ray techniques for chip testing and failure analysis
Published: March 18, 2020
Engineers from Nikon Metrology Inc. discussed x-ray technologies and techniques that can provide visualization and metrology analysis of semiconductor chips, at the ASM International ISTFA 2019 conference in Portland, Oregon.
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