SEMI World Fab Forecast predicts modest growth in 2020, record investments in 2021

Published: March 18, 2020

SEMI, Milpitas, Calif., reports in its World Fab Forecast that global fab equipment spending promises to rebound from its 2019 downturn and see a modest recovery this year before a sharp uptick drives record investments in 2021.

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Park Systems and Imec join to increase nano-metrology solutions for semiconductors

Published: March 18, 2020

Park Systems, Santa Clara, Calif., and Imec, Belgium, have signed the second Joint Development Project (JDP) within four years to increase the development efforts for future generation in-line AFM metrology solutions.

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Multi-beam SEM enables imaging larger areas of semiconductor layers in less time

Published: March 18, 2020

Engineers from Carl Zeiss Microscopy, Germany, presented a discussion of multi-beam scanning electron microscopes as tools for imaging semiconductor layers in less time at the ASM International ISTFA 2019 conference in Portland, Oregon.

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Nondestructive method developed for short-fault localization in advanced IC packages

Published: March 18, 2020

Researchers from Advanced Micro Devices and TeraView Ltd. presented a discussion of an electro optical terahertz pulse reflectometry method for short fault localization in advanced IC packages at the ASM International ISTFA 2019 conference in Portland, Oregon.

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Hitachi High-Tech Corporation receives Intel’s Preferred Quality Supplier Award

Published: March 15, 2020

Hitachi High-Tech Corporation, Tokyo, has been recognized by Intel as a recipient of a 2019 Preferred Quality Supplier (PQS) award, by which Intel recognizes companies such as Hitachi High-Tech that Intel believes have relentlessly pursued excellence and conducted business with resolute professionalism

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Ametek Gatan K3 camera provides first 3D atomic-scale map of coronavirus structure

Published: March 15, 2020

Ametek Gatan, Berwyn, Pa., reports that researchers at the University of Texas at Austin and the National Institutes of Health created the first 3D atomic-scale map of the 2019 novel coronavirus.

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Mentor Graphics Quantix Examinator enables desktop semiconductor test data analysis

Published: March 15, 2020

Mentor Graphics, Wilsonville, Oregon, offers the Quantix Examinator-Pro, which provides product and test engineers everything they need to characterize new ICs and test programs. It turns standard test data files into comprehensive reports, and enables engineers to drill down into the data interactively for root-cause analysis.

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Lam transforms plasma etch technology to enable advanced functionality and extendibility

Published: March 15, 2020

Lam Research Corp., Fremont, Calif., announces the launch of a completely transformed plasma etch technology and system solution, designed to provide chipmakers with advanced functionality and extendibility required for future innovation.

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Federal interagency working group to prioritize semiconductor R&D across U.S. agencies

Published: March 15, 2020

The Semiconductor Industry Association (SIA), Washington, reports that the White House Office of Science and Technology Policy (OSTP) has announced a new interagency working group focused on advancing semiconductor R&D.

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Oxford Instruments Xplore EDS detector offers rapid data collection for live EDS analysis

Published: February 24, 2020

Oxford Instruments, England, introduces the Xplore EDS detector, available with a 30 mm2 sensor area and designed for a wide range of applications.

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