Rave mask repair/cleaning business now part of Bruker semiconductor metrology division

Published: April 11, 2019

Bruker Corp., Billerica, Mass., announces that it has acquired the semiconductor mask repair and cleaning business of Rave LLC, a leading provider of nanomachining and laser photomask repair equipment. For calendar year 2018, the acquired business was profitable and had revenues of approximately $25 million. Financial details of the transaction were not disclosed, and the business has now become part of Bruker’s semiconductor metrology division.

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SEMI launches initiative to build talent pipeline critical to global electronics industry

Published: March 22, 2019

SEMI, Mil[pitas, Calif., the global industry association serving the electronics manufacturing supply chain, announces SEMI Works, a comprehensive program to attract, develop and retain the talent critical to the worldwide electronics industry’s continued innovation and growth.

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Bruker wins IF Design awards for three different spectrometer products

Published: March 22, 2019

Bruker, Munich, has been awarded the IF (International Forum) Design Award for three different products: the FT-IR spectrometers Invenio and Alpha II, as well as the FT-NIR spectrometer MPA II in the categories “Industry” and “Medicine/Health” of the discipline “Product Design.”

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Cambridge spin-out company produces graphene sheets one atomic layer thick for wafers

Published: March 22, 2019

Paragraf, a recent University of Cambridge spin-out company in England, has started producing graphene – a sheet of carbon just one atomic layer thick – at up to eight inches (20 cm) in diameter, large enough for commercial electronic devices.

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Hitachi High-Tech micro-spot XRF analyzer now offered by Eastern Applied Research

Published: March 22, 2019

Eastern Applied Research, Buffalo, N.Y., recently named as an Authorized Distributor of Hitachi High-Tech Science Corp., now offers an XRF analyzer developed for ultrathin film measurements and micro-spot analysis needs: the Hitachi FT-150 series.

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Witec analysis tool enables Raman microscopes to identify and classify particles

Published: March 21, 2019

Witec GmbH, Germany, pioneer of Raman imaging and correlative microscopy, introduces ParticleScout, a particle analysis tool that enables researchers to find, classify, quantify, and identify particles quickly and easily with the Alpha300 Raman microscope series.

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Bruker wins IF Design awards for three different products

Published: March 21, 2019

Bruker, Munich, has been awarded the IF (International Forum) Design Award for three different products: the FT-IR spectrometers Invenio and Alpha II, as well as the FT-NIR spectrometer MPA II in the categories “Industry” and “Medicine/Health” of the discipline “Product Design.”

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Rigaku EDXRF instrument analyzes elements from Na through U in almost any matrix

Published: March 21, 2019

Rigaku, Japan, announces the newest addition to the NEX DE series, the Rigaku NEX DE VS direct excitation variable-spot EDXRF elemental analyzer, which is uniquely suited for small spot analysis applications.

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Keyence 3D Scanner CMM VL Series captures surface data and color information

Published: March 21, 2019

Keyence, Itasca, Ill., has launched its new VL Series of 3D Scanner CMM, which provides a structured light scanner with full 360 degree measurement and claims fully traceable measurements of ±10 μm accuracy with 2 µm repeatability.

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Leica DM3 XL microscope features macro objective with 30% larger field, LED lighting

Published: March 21, 2019

Leica Microsystems, Buffalo Grove, Ill., introduces the Leica DM3 XL microscope system that includes a macro objective enabling a 30% increase in field of view and a wide choice of different stage inserts: metal inserts, wafer holders, and mask holders.

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