Bruker X-ray diffraction imaging systems offer in-line monitoring of wafer crystalline defects

Published: July 25, 2017

Bruker Semiconductor Division, Billerica, Mass., announces that leading multiple semiconductor manufacturers have ordered JVSensus-600E X-ray diffraction imaging systems for in-line wafer monitoring of crystalline defects.

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Shape-memory, self-healing effects demonstrated in gold microparticles

Published: July 13, 2017

The Technion-Israel Institute of Technology, Israel, and the Karlsruhe Institute of Technology, Germany, announce that their researchers have demonstrated for the first time the phenomena of shape memory and self-healing in gold microparticles.

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Oxford Instruments Industrial Analysis business joins Hitachi to form new company

Published: July 12, 2017

Oxford Instruments, England, announces that its Industrial Analysis business will join Japan's Hitachi High-Technologies to form a new company, Hitachi High-Tech Analytical Science.

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Optomec awarded NASA contract for 3D printing of electronics by ALSS

Published: June 26, 2017

Optomec, Albuquerque, N.M., announces that the company has been awarded a NASA SBIR contract for the further development of an adaptive laser sintering system (ALSS) for electronics.

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Leica DM3 XL microscope system inspects wafers fast with 30% larger field of view

Published: June 19, 2017

Leica Microsystems Inc., Buffalo Grove, Ill., has developed the DM3 XL microscope inspection system for process control or defect and failure analysis in the microelectronics and semiconductor industry.

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Brewer Science sells its semiconductor processing equipment business unit

Published: June 19, 2017

Brewer Science, Rolla, Mo., announces that its Cee semiconductor processing equipment business unit has been sold to former Brewer Science employee Russ Pagel, who has formed a new company, Cost Effective Equipment LLC, to take over ownership and operate the business.

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Bruker launches next-gen WDXRF spectrometer for advanced quantitative analysis

Published: June 19, 2017

Bruker Corp., Germany, launches its S8 Tiger Series 2, the next-generation wavelength dispersive X-ray fluorescence spectrometer, said to be the most versatile WDXRF tool available for advanced quantitative elemental analysis.

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Compact mass spectrometer designed for analysis of semiconductor process gases

Published: June 19, 2017

JEOL USA, Peabody, Mass., introduces its new compact InfiTOF mass spectrometer, which is designed for real-time, direct gas introduction and analysis.

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Hitachi’s Regulus field emission SEMs feature resolution down to 0.9 nanometer

Published: June 19, 2017

Hitachi High-Technologies Corp., Japan, introduces the new Regulus series of field emission scanning electron microscopes that offer enhanced functionality with improved resolution and operability.

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Imec and Cascade Microtech develop pre-bond testing system for advanced 3D chips

Published: June 18, 2017

Imec, Belgium, and Cascade Microtech, Germany, announce the successful development of a fully automatic system for pre-bond testing of advanced 3D chips.

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