Compact mechanical test system fits inside scanning electron microscopes

Published: January 22, 2017

MTI Instruments, Albany, N.Y., introduces the MTII/Fullam SEMtester compact mechanical test system, which is specifically designed to fit inside scanning electron microscopes.

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Malvern and Panalytical merge to grow materials analysis business

Published: January 22, 2017

Malvern Instruments, England, and Panalytical, The Netherlands, announce that on January 1 they merged their activities to grow the materials characterization business within the Materials Analysis segment of parent company Spectris.

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Optical microscopy/laser spectroscopy instrument identifies micron-size particles

Published: January 22, 2017

Researchers at the Massachusetts Institute of Technology's Lincoln Laboratory, Cambridge, report that they have developed a microscope in which optical microscopy is combined with laser spectroscopy to enable identification of individual micron-sized particles.

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Semiconductor assembly/testing services poised for steady growth

Published: January 22, 2017

Future Market Insights (FMI), Valley Cottage, N.Y., releases its latest report on the semiconductor assembly and testing services market, predicting that it will primarily be driven by the surging demand for high-end packaging solutions.

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SUNY Poly-managed graphene p-n junction breakthrough wins physics award

Published: January 21, 2017

Research managed by SUNY Polytechnic Institute, Utica, and conducted by a number of collaborating institutions, has led to findings that have been named a top ten 2016 breakthrough in physics by Physics World.

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Praxair opens air separation plant at Samsung Electronics in South Korea

Published: January 21, 2017

Praxair Inc., Danbury, Conn., has begun operations at its fourth air separation plant, a 1400-ton-per-day unit, and has upgraded the nitrogen pipeline system serving the Samsung site in Gyeonggi Province, South Korea.

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3D optical microscope provides high combined lateral and vertical resolution

Published: January 17, 2017

Bruker Corp., Billerica, Mass., reports that its Contour Elite 3D optical microscopes provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems, such as R&D applications within the semiconductor and MEMS markets.

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Magnesium-scandium alloys show superelastic and shape memory properties

Published: January 16, 2017

Tohoku University, Japan, announces that a newly discovered magnesium-scandium alloy with a bcc structure shows a martensitic transformation and exhibits the superelastic effect at ?150°C (?238°F).

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NIST awards $12 million to MEP centers in 11 states to support manufacturers

Published: January 15, 2017

The National Institute of Standards and Technology, Gaithersburg, Md., announces that its Hollings Manufacturing Extension Partnership (MEP) program has awarded a total of nearly $12 million in first-year funding to 11 organizations that will operate MEP centers in Delaware, Hawaii, Iowa, Kansas, Maine, Mississippi, Nevada, New Mexico, North Dakota, South Carolina, and Wyoming.

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New electrochemistry ability enables Cypher ES AFM to study deposition, corrosion

Published: December 19, 2016

Oxford Instruments, Santa Barbara, Calif., announces that electrochemistry capabilities are now available on the Cypher ES atomic force microscope, the highest resolution, fast scanning AFM with environmental control.

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