DCG Systems, Fremont, Calif., announces that three of its nProber II nanoprobing systems have been purchased by a major IC manufacturer who is developing technology beyond the 14nm node. The nProber II system was selected for its ability to isolate electrical faults to the sub-transistor level, and to characterize the electrical properties of individual transistors and interconnects. The nProber II addresses the escalating process challenges brought by shrinking critical dimensions, three-dimensional transistor structures, and increasing pattern density.
“To navigate their product roadmaps, our customers are turning to creative geometries and materials—and as a result are encountering a new generation of electrical faults at final test that are often missed by traditional inline process control systems,” said Israel Niv, Ph.D., Chief Executive Officer of DCG Systems. “After functional test methods identify a failure at the macro level, the nProber II system is employed to isolate and characterize the underlying electrical fault. The nProber II enables the engineer to drive to the root cause of a process issue efficiently.”
“Having the nProber II system named tool of choice by an industry leader speaks to its value,” added Mike Berkmyre, General Manager of the nanoInstruments Division at DCG Systems. “After a multi-year development effort, our engineers have achieved advances in the nProber II technology that enable thorough characterization of planar or 3D transistors and interconnects with significantly improved ease-of-use and speed. The nProber II is proving critical to next-generation chip development.”
