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Thermo Scientific’s Prisma E SEM features high-res imaging system based on tetrode gun

Thermo Scientific, Hillsboro, Ore., introduces its Prisma E scanning electron microscope, which combines a wide array of imaging and analytical modalities with advanced automation for industrial R&D, quality control, and failure analysis. It is said to be ideal for applications that require high resolution, sample flexibility, and an easy-to-use operator interface. Prisma E succeeds the Quanta SEM.

 Multi-user laboratories require a microscope to produce high quality images with relevant data in a short amount of time. Prisma E fulfills this need with a robust imaging system based on a tetrode gun assembly that delivers excellent results at a wide range of beam energies and vacuum conditions. In all these conditions, both topographic and compositional images provide the necessary sample information. With simultaneous acquisition, this information is readily available for further interpretation and analysis.

Finding the region of interest or even finding the sample itself can be a tedious task, but not on Prisma E. The in-chamber navigation camera (Nav-Cam) provides a detailed photo of the sample holder, which makes it easy to work with multiple samples in one session, and to navigate to them one by one. Within a sample, you’ll go to the region of interest by simply clicking it. The Nav-cam image rotates along with the sample, so that navigation is truly intuitive.

The increasing need for elemental (EDX, WDS) and crystallographic (EBSD) sample data is accommodated by Prisma E’s analytical chamber (shown in the photo), which supports multiple EDX detectors to increase throughput and remove shadowing effects. In addition, the analytical chamber supports coplanar EDX/EBSD and parallel beam WDS to ensure optimum positioning for all techniques. Thanks to Prisma E’s in situ capabilities, reliable analytical results are obtained even on samples that are insulating or at high temperature.

Additional sample information for photonics, geoscience, ceramics, glass, and failure analysis applications comes from the unique retractable RGB cathodoluminescence detector.

Guided workflows make the system easy to learn and operate. For example, a convenient undo/redo feature enhances productivity. The MAPS package can create large-area composite maps from multiple images and spatially correlates the data.

https://www.fei.com/products/sem/prisma-esem-for-materials-science/  

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