Edax Inc., Mahwah, N.J., has launched its new Velocity electron beam backscatter diffraction (EBSD) camera, which offers high-speed EBSD mapping with the highest indexing performance on real-world materials.
Powered by a CMOS sensor, the Velocity EBSD camera combines indexing speeds greater than 3000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven Edax triplet indexing routines, provides orientation precision values of less than 0.1.
The Velocity EBSD camera can be integrated with compatible Edax EDS detectors to provide an analytical system for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. When combined with ChI-Scan analysis, this results in useful integrated data for accurate phase differentiation.
This new addition to the Edax portfolio of EBSD cameras, offers users a further option for high-speed mapping and accurate indexing needed to resolve crystallographic microstructures and help solve materials characterization challenges quickly and easily.
