Rigaku Corp., Japan, introduces the new sixth generation Rigaku MiniFlex benchtop x-ray diffractometer for qualitative and quantitative analysis of polycrystalline materials. It is designed to deliver speed and sensitivity through innovative technology enhancements, such as the HyPix-400 MF 2D hybrid pixel array detector coupled with a 600 W x-ray source and new 8-position automatic sample changer.
The Miniflex is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to the MiniFlex series of benchtop x-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex XRD system decades ago.
The HyPix-400 MF 2D hybrid pixel array detector (HPAD), together with an available 600 W x-ray source and new 8-position automatic sample changer, delivers speed and sensitivity. This new direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis, and 2D mode for samples with coarse grain size and/or preferred orientation.
A variety of x-ray tube anodes – along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments – are offered to ensure that the MiniFlex x-ray diffraction (XRD) system is versatile enough to perform challenging qualitative and quantitative analyses of a broad range of samples, whether performing research or routine quality control.
