Bruker Corp., Billerica, Mass., has released its new Contour Elite 3D Optical Microscopes, which for the first time fully integrate high-definition microscopy imaging with industry-leading three-dimensional optical metrology functionality. It provides high-speed operation, accuracy, and repeatability, as well as the imaging and display advantages commonly associated with confocal microscopy.
For those familiar only with imaging microscopes, Contour Elite systems add the ability to acquire quantitative measurements with significantly higher density sampling. It combines high-throughput sub-nanometer vertical resolution metrology with enhanced imaging capability. It makes the Contour Elite microscopes ideal for microelectronics.
“Our previous Bruker system has been a workhorse for rapid, accurate measurement results, but now with the new Contour Elite 3D optical microscope, we can simultaneously acquire nanometer-scale metrology data and true images of our clients’ samples,” said Thomas F. Fister, Ph.D., Senior Director of Analytical Services at Evans Analytical Lab, CA, USA. “The ability to use high-definition and color imaging also allows us to segment the data based on color, adding another powerful capability to our measurement services. The Contour Elite makes locating sample surfaces very intuitive, and the stunning images are great for reporting results to our clients.”
“The Contour Elite microscopes are the first commercially available white light interferometry-based metrology systems that combine proprietary highest resolution imaging algorithms with innovative hardware enhancements to obtain both nanometer-scale metrology data and high-definition true images of samples,” added Kent Health, General Manager of Bruker’s Stylus and Optical Metrology Business. “Successful characterization of samples in research institutions, industrial R&D facilities, and QA/QC labs requires accurate measurements, crisp imaging and rapid throughput, all of which are combined here in a single platform. Contour Elite is a true successor of Bruker’s long-standing tradition of pushing the boundaries of measurement capability while taking the complexity out of operation and analysis.”
