Carl Zeiss X-ray Microscopy Inc., Germany, introduces the Xradia Versa X-ray 500-series of 3D X-ray microscopes with FPX flat panel extension, which enhances imaging flexibility and creates workflow efficiencies. Users can now scout large samples two to five times faster to identify a region of interest. They can then zoom to image areas at high resolution with the Zeiss Xradia Versa RaaD dual magnification microscope objectives that enable resolution at a distance.
FPX extends the ability for the Xradia Versa XRM to achieve full field of view, whole-sample imaging, up to five inches in diameter for samples ten times greater in volume with higher throughput.
According to Howard Marks, Director of Technology Operations at the Silicon Failure Analysis Lab at Nvidia, “We are now able to quickly and effectively perform inspection, analysis, and root cause determination in minimal time with our new Zeiss Xradia Versa with FPX.”
ZEISS Xradia Versa with FPX offers unique capabilities in a number of research areas:
In the electronics, automotive, and medical industries, product development requires process optimization, design compliance verification, and failure analysis at the system, module, and component level. With Zeiss FPX, fine details may be imaged seamlessly from system to components with an all-in-one tool to enhance efficiency. Engineers may complete these tasks by scanning an entire intact device, such as a smartphone, then zoom to a processor or battery module, and finally to the interconnect or material structure, respectively.
In the oil and gas industry, the instrument enables highly effective imaging of large samples, including 4-inch diameter whole core. Integrated Scout-and-Zoom workflows offer non-invasive proscriptive sampling using interior tomography as an alternative to mechanical sampling, to achieve characterization of heterogeneity at a level not previously possible. It enables high throughput multiscale imaging, characterization, and modeling (from 4-inch core to sub-micron scale) of reservoir samples, all on a single system.
