SEMI Americas, Milpitas, Calif., and Semiconductor Digest announce that Advantest, Tokyo, was a finalist in the Best of West awards for its V93000 Wave Scale Millimeter Solution, which has been extended to support multi-band testing at the fast interface speeds used by 5G devices.
To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. Advantest’s Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices.
Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both today’s and emerging LTE, LTE-Advanced, and LTE-A Pro smart phones, as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth, and IoT applications. The cards’ advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test.
