Materials engineer Pablo Mendoza of Allied High Tech Products Inc., Rancho Dominguez, Calif., presented an effective method of sample preparation for transmission electron microscopy at the ASM International MS&T 2019 Exposition in Portland, Ore.
Sample preparation via mechanical abrasive methods for transmission electron microscopy (TEM) is one of the many techniques Allied High Tech has developed. The small sample thickness requirement poses a challenge regardless of the method. While other procedures are possible, such as ion milling or chemical etching, mechanical preparation can yield great results.
TEM sample preparation is an involved process requiring utmost diligence and care. It is a delicate, careful procedure that is highly dependent on removing all previous processing deformation when at the final thickness, to ensure sample stability. Optical microscopes are an essential tool to assist in the preparation of such samples.
This presentation outlined the important aspects of the preparation process, including thinning, polishing, wedge creation, and imaging, for bulk and site-specific applications.
Title: Mechanical TEM Sample Preparation
Authors: Pablo Mendoza and Jessica Enos, Allied High Tech Products Inc., Rancho Dominguez, California.
