WIN Semiconductors Corp., Taiwan, has completed Phase 2 expansion at its newest wafer fab, Fab C, increasing manufacturing capacity by 20%.
WIN Semiconductors completes expansion, increases GaAs wafer capacity by 20%
Rogers to exhibit high-performance circuit materials at microwave symposium
Rogers Corp., Chandler, Ariz., will highlight its wide range of circuit materials at the 2017 IEEE International Microwave Symposium in June.
CMOS-based electron backscatter diffraction detector acquires 3000 patterns/second
Oxford Instruments Nanoanalysis, England, has launched Symmetry, which is said to have acquisition speed in excess of 3000 indexed patterns per second.
Kyocera certified to supply ceramic semiconductor packaging for space vehicles
Kyocera International Inc., San Diego, announces that it has received Class Y certification for its semiconductor assembly operations.
Two-sensor-tool imaging technology detects dead open faults with high accuracy
Neocera, Beltsville, Md., has developed the Magma electronic fault isolation HiRes microscope system that combines two sensors into one tool: a SQUID sensor for detecting the smallest possible currents, and a magnetoresistive sensor for best spatial resolution when scanning close to the current.