Oxford Instruments to sell Industrial Analysis business to Hitachi High-Technologies
Oxford Instruments plc, England, announces that it has agreed to sell its Industrial Analysis business to Hitachi High-Technologies Corp. for a consideration of $100 million on a cash and debt-free basis.
Hitachi ion-milling system capable of high-speed and wide-area material processing
Hitachi High-Technologies Corp., Tokyo, announces the Hitachi ArBlade 5000 broad ion-milling system, which enables high throughput and prepares wide-area cross-sectional samples.
Lasertec hybrid confocal microscope combines laser and white light sources
Lasertec, Japan, introduces the Optelics Hybrid confocal microscope, in which laser and white light sources are combined in one body, for a multi-functional high-performance confocal microscope.
JEOL scanning electron microscope features ultrahigh resolution images of large samples
JEOL USA, Peabody, Mass., introduces a new scanning electron microscope that combines the performance of a field emission SEM with the simplicity of the JEOL InTouchScope SEM series.