Bruker Nanoanalytics, Germany, introduces the e-FlashFS and e-FlashHD, two models of a new generation of detectors for electron backscatter diffraction analysis on scanning electron microscopes; and Esprit Qube, a new software package for advanced post-processing and visualization of 3D EBSD/EDS data cubes.
Instron, Norwood, Mass., has designed the Instron Torsion Add-On for simple simultaneous axial and torsional testing to ensure the performance of many consumer products, packaging, electronics, and medical devices.
Thermo Fisher Scientific, Boston, introduces Pathfinder X-ray microanalysis software, which is designed to process incoming data from X-ray detector technology and to provide a real-time statistical map of the chemical constituents within a sample.
TA Instruments, New Castle, Del., announces that the ElectroForce 3310, the newest addition to the TA Instruments ElectroForce load frame family, delivers 1 kN of force capacity with 25 mm of dynamic displacement.
Newage Testing Instruments, Southampton, Pa., introduces the MT91 Automatic Microhardness Traverse Testing System, which offers testing speed as fast as six seconds per test cycle and a precise Rockwell type testing method that requires no manual interpretation of the impression.
