Imec Nano-Electronics Research Center, Belgium, is extending its gallium nitride-on-silicon (GaN-on-Si) R&D program.
Hitachi NX9000 enables real-time 3D structural analysis
Hitachi High-Technologies Corp., Japan, has released the NX9000 real-time 3D analytical FIB 1-SEM 2 composite instrument.
Amkor to invest $60 million in China to expand assembly and test facility
Amkor Technology Inc., Tempe, Ariz., announces plans to invest $60 million to expand its state-of-the-art assembly and test factory located in China’s Shanghai Waigaoqiao Free Trade Zone.
Hybrid instrument combines photonic-nanomechanical force microscopy and nanospectroscopy
A microscope being developed at the Department of Energy’s Oak Ridge National Laboratory in Tennessee will allow scientists studying biological and synthetic materials to simultaneously observe chemical and physical properties on and beneath the surface.
Oxford Instruments launches silicon drift detector with ultrahigh resolution at low kV
Oxford Instruments, U.K., has launched X-Max Extreme, a silicon drift detector for ultrahigh resolution FEG and FIB-SEM applications.