Zeiss Microcopy, Germany, introduces extensions on Zeiss Crossbeam 350/550 and Zeiss Atlas 5 that enable faster accessibility to deeper regions of interest when investigating material samples in three dimensions. They improve both speed and data quality during multi-scale, multi-modal studies in additive manufacturing, electronics, and battery research.
Enhanced correlative workflows are now included due to improvements in relocation of regions of interest when guiding LaserFIB or FIB-SEM workflows using x-ray microscopy data. Users can take advantage of relocating regions of interest faster and more accurately.
Once a region has been located, “thin & fast” tomography takes over. This is a method for tomogram acquisition, slice thickness measurement, and improved visualization and data processing with patented True-Z technology. True-Z measures each slice thickness in turn and reconstructs the tomogram accounting for variability in z slice thickness. This provides greater accuracy for the final reconstructed volume, making 3D and 4D modeling more accurate and increasing precision of segmentation when investigating 3D volumes.
Enhancements to a toolbox in Zeiss Atlas 5 now enable each user to analyze, present, and share results more effectively than ever. Correlated data of a multi-modal dataset are visible at one glance with simultaneous visualization of up to four imaging or analytic modalities. Storyboarding, the production of curated slideshows and the possibilities of digital education are facilitated by the new Enhanced Browser-Based Viewer Export Module.
