Keysight Technologies, Santa Rosa, Calif., announced Keysight Multiphysics, a design and verification solution that addresses the physics interactions driving failure in modern electronic designs, featuring a structural analysis application covering drop, shock, and vibration that enables engineering teams to identify and fix problems earlier, before a prototype is built.
Continue readingTescan Micro-CT to FIB-SEM: A smarter FA workflow for advanced packaging
Tescan, Czech Republic, unifies non-destructive Micro-CT, ultrafast laser processing, and high-precision FIB-SEM into a single, integrated workflow to accelerate root-cause determination in advanced semiconductor packaging while minimizing preparation-induced artifacts.
Continue readingCamtek acquires Visual Layer to deepen its visual AI capabilities in its inspection and metrology offering
Camtek Ltd., Israel, a leading developer and manufacturer of inspection and metrology equipment for the semiconductor industry, has signed a definitive agreement to acquire Visual Layer, a Tel Aviv-based AI company specializing in visual analytics.
Continue readingCosmic is born: A new global player for semiconductor test solutions – built on decades of experience
Following an international expansion strategy initiated in 2022, a new global semiconductor test solutions group named Cosmic has been formed by uniting specialized industrial companies from Italy, the Netherlands, Germany, the United Kingdom, and the United States into two independent divisions: Cosmic Equipment and Cosmic Services.
Continue readingElectron microscopy shows ‘mouse bite’ defects in semiconductors
Cornell researchers, Ithaca, N.Y., have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance using a new imaging technique called electron ptychography.
Continue readingApplied Materials accelerates chip defect review with next-gen eBeam system
Applied Materials, Inc., Santa Clara, Calif., introduced a new defect review system to help semiconductor manufacturers continue pushing the limits of chip scaling combining the industry’s most sensitive electron beam technology with advanced AI image recognition to enable better and faster analysis of buried nanoscale defects.
Continue readingBackblaze publishes 2025 Drive Stats Report: 13 years of data show a growing, healthier drive fleet
Backblaze, Inc., San Mateo, Calif., published its 2025 Year-End Drive Stats report that analyzes the performance of 344,196 hard drives across 30 models and found the annual failure rate drops to 1.36% across 344,000+ drives and high-capacity models are on the rise as first 26TB drives enter service.
Continue readingGE Aerospace invests $300M USD to bolster engine repair capabilities in Singapore
Partnership between GE Aerospace, Cincinnati, Ohio and the Singapore Economic Development Board brings AI-enabled inspection, predictive maintenance, and automated repair to speed turnaround and improve connectivity and customer experiences.
Continue readingTexas awards $4.16M semiconductor innovation grant to Arm Inc. for major Austin expansion
Governor Greg Abbott announced that a Texas Semiconductor Innovation Fund grant of $4,162,550 has been extended to Arm Inc. for an expansion of their Austin campus to include a new semiconductor lab with failure analysis capabilities.
Continue readingBrowserStack bridges developer-QA productivity gap with test failure analysis agent
BrowserStack, Ireland, the world’s leading software testing platform, launched its AI-powered Test Failure Analysis Agent, an autonomous system that debugs test failures with QA-level accuracy up to 95% faster, directly addressing the widening productivity gap between developers and QA teams.
Continue readingWhy light poles failed in Hurricane Ian despite meeting design standards
A new University of Florida study reveals how hidden flaws in design and installation of aluminum light poles on a Central Florida bridge contributed to their unexpected collapse when Hurricane Ian moved across Florida in 2022, even though wind speeds remained below the structures’ design limits.
Continue readingIncorrect torque tube installation led to E190 airliner slat failure
An E190 airliner had a slat failure on approach to Launceston, Tasmania, Australia after a torque tube was incorrectly installed during recent maintenance, an ATSB investigation report details.
Continue readingNew nanoprobing platform for high voltage applications
Imina Technologies SA, Switzerland, released a new Nanoprobing High-Voltage Platform designed to safely apply voltages up to 1 kV through both nanoprobing tips and the backside of the sample, addressing the growing need for reliable electrical characterization of wide-bandgap and high-power semiconductor devices such as SiC- and GaN-based MOSFETs, IGBTs, and other devices.
Continue readingOxford Instruments wins prestigious Institute of Physics business award
Oxford Instruments, UK, has been awarded a prestigious Institute of Physics Business Innovation Award for the development of BEX, a breakthrough analytical technique in scanning electron microscopes, enabling new capabilities and accelerating time to results by at least an order of magnitude.
Continue readingIntertek Caleb Brett opens new laboratory in Naples, Italy
Intertek, UK, a leading Total Quality Assurance provider to industries worldwide, announced the opening of a new Intertek Caleb Brett laboratory in Naples, Italy, strengthening its presence in this important region and addressing a growing demand for reliable, high-quality testing services in crude oil, refined fuels, and emerging biofuels.
Continue readingTescan announces Carlyle agreement with Shimadzu Corporation
Tescan, Czech Republic, announces that Carlyle, together with the other shareholders, has entered into a definitive agreement with Shimadzu Corporation, Japan, for the sale of the company, resulting in a change in Tescan’s shareholding structure.
Continue reading3D-Micromac introduces next-generation laser sample preparation platform for whole semiconductor wafer and system-level failure analysis
3D-Micromac AG, Germany, introduced microPREP L, a laser-based sample prep system that supports up to whole 12-inch wafers and system-level boards, enabling fast, precise, reproducible, and non-destructive material removal for semiconductor failure analysis and quality assurance.
Continue readingTescan acquires FemtoInnovations and launches Laser Technology Business Unit
Tescan Group, Czech Republic, acquired FemtoInnovations, a leading innovator in ultrafast laser technologies, and created a new dedicated Laser Technology Business Unit headquartered at the University of Connecticut Tech Park that expands Tescan’s correlative and multimodal portfolio for semiconductor, biomedical device manufacturing, and advanced research markets.
Continue readingEngineering defects could transform the future of nanomaterials
Materials scientists at the University of Minnesota Twin Cities have found a way to create and control tiny internal “flaws” inside ultra-thin materials known as extended defects, that could give next-generation nanomaterials entirely new properties, opening the door to advances in nanotechnology.
Continue readingToyota recalls over 1 million vehicles for camera problems
Toyota and Lexus have launched one of the year’s biggest recalls, affecting over a million vehicles from 2023–2026 due to a parking assist camera issue.
Continue readingOxford Instruments launched witec360 Raman microscope with Hexalight spectrometer
Oxford Instruments’ Raman imaging team in England announced a refreshed core microscope line and a groundbreaking new spectrometer, Hexalight, which together with the witec360 microscope constitute the most advanced confocal Raman imaging system yet devised.
Continue readingExosens expands technology portfolio
Exosens, France, extends its technology portfolio by signing an agreement to acquire Phasics, France, leader in high performance cameras based solutions for optical metrology.
Continue readingGatan launches the EDAX Orbis II Micro-XRF system
Gatan, Inc., Pleasanton, Calif., launched the EDAX Orbis II System, designed to support a wide range of non-destructive elemental analysis that use micro x-ray fluorescence.
Continue readingResearchers outline innovative ways to track heat in advanced semiconductors
Researchers from UConn and the U.S. Naval Research Laboratory have outlined new ways to accurately track and manage heat in ultrawide bandgap semiconductors, a challenge that has become increasingly important as these materials drive the future of high-performance electronics.
Continue readingInstron launches new AVE3 Advanced Video Extensometer
Instron, Norwood, Mass., released the AVE3, an advanced non-contacting video extensometer that delivers precise strain measurement with unparalleled, micron-level accuracy for tensile, compression, and bend testing.
Continue readingiST launches Global Smart Reliability Center to accelerate front-end validation for AI and EV applications
Integrated Service Technology Inc., Taiwan, a leading provider of electronic product verification and analysis services, launched its Global Smart Reliability Center, developed in response to the growing demand for early-stage reliability testing in AI, high-performance computing, and electric vehicle applications.
Continue readingSigray unveils the Apex-Hybrid: a breakthrough 3D x-ray system for failure analysis and electronics reverse engineering
Sigray, Inc. of Benicia, Calif. has launched the Apex-Hybrid, a breakthrough X-ray system designed to revolutionize failure analysis in semiconductor and electronics labs with interchangeable laminography and tomography modes, delivering exceptional speed and 350nm high-resolution imaging for everything from large packages and PCBs to the smallest components.
Continue readingBearing failure analysis identifies lubrication issues at South African sugar refinery
SKF, Sweden, and Bearings Services Durban, South Africa, conducted a collaborative bearing failure analysis at Tongaat Hulett’s sugar refinery in Durban, South Africa, identifying inadequate lubrication as the root cause of rolling contact fatigue and providing corrective measures to prevent future failure.
Continue readingESi expands footprint with new office in New Jersey
Engineering Systems Inc., Aurora, Ill., expanded its Northeast presence by opening a new office in Lincoln Park, New Jersey, enhancing its ability to serve clients in the tri-state area with direct access to its nationwide network of experts and laboratories.
Continue readingSwRI provides rapid response to address critical aging aircraft issue
Southwest Research Institute, San Antonio, Texas, collaborated with the U.S. Air Force to enhance fleet safety by developing advanced risk and damage tolerance analyses that led to a more effective inspection schedule for the T-38 Talon-helping detect cracks before they become critical.
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