-
1458 items found
Electroplating can eliminate gold waste in electronic devices
Published: June 06, 2016
ClassOne Technology, Kalispell, Montana, announces that its Solstice gold plating systems can save money for makers of electronic devices by eliminating gold waste, reducing the amount of gold needed, and simplifying the gold plating process.
News, Magazine & Media / Industry News
Long-life flexible printed electronics encapsulated with Picosun ALD
Published: June 06, 2016
Picosun Oy, Finland, brings to the printed electronics market ALD equipment specifically designed for large-area flexible electronics encapsulation.
News, Magazine & Media / Industry News
The world loses Karl A. Gschneidner
Published: June 06, 2016
Ames Laboratory Senior metallurgist Karl A. Gschneidner Jr., known around the world as Mr. Rare Earth, passed away April 27 at the age of 85.
News, Magazine & Media / Industry News
IMS Welcomes the Failure Analysis Society
Published: June 02, 2016
On behalf of the International Metallographic Society and its board of directors, I would like to welcome the new ASM affiliate, the Failure Analysis Society.
News, Magazine & Media / Industry News
Rare earth elements extracted from coal ash
Published: June 01, 2016
Duke University, Durham, N.C., reports that its researchers have extracted rare earth elements from coal ash that contains amounts ranging from 337 to 591 ppm, depending on location.
News, Magazine & Media / Industry News
Case History from ASM Failure Analysis Database: Overheating of Aircraft Engine Cylinders
Published: May 20, 2016
Cylinder fatigue can be due to abnormal heating in service, also experienced by piston heads, exhaust valves, and turbosupercharger housings (castings). As a note, pistons from different engines series can sometimes fit, but due to slight design modifications, they may not function properly. Always make sure that the correct piston is used for a specific engine model.
News, Magazine & Media / Industry News
Bruker launches compact research grade Raman microscope
Published: May 19, 2016
Bruker, Munich, Germany, launches the Senterra II compact Raman microscope, with a fully redesigned spectrograph that can achieve higher spectral resolution in addition to higher performance compared to previous models.
News, Magazine & Media / Industry News
FEI launches Apreo high-performance SEM
Published: May 19, 2016
FEI Co., Hillsboro, Ore., introduces the Apreo SEM, which provides high-resolution surface information with excellent contrast, and has the flexibility to accommodate a wide range of samples, applications, and conditions.
News, Magazine & Media / Industry News
ON Semiconductor extends tender offer to acquire Fairchild Semiconductor
Published: May 19, 2016
ON Semiconductor Corp., Phoenix, has extended its previously announced tender offer to purchase all of the outstanding shares of common stock of Fairchild Semiconductor International Inc. for $20.00 per share in cash to May 26, unless further extended.
News, Magazine & Media / Industry News
Oxford Instruments launches software platform for Maxxi 6 coating analyzer
Published: May 19, 2016
Oxford Instruments, Abingdon, U.K., enhances the Maxxi 6 coating thickness and materials analyzer with the introduction of SmartLink software, combining powerful yet easy-to-use software with high-resolution detector technology.
News, Magazine & Media / Industry News
