-
1458 items found
Software enables microspectrophotometers to make fast measurements of thin films
Published: October 20, 2014
Craic Technologies, San Dimas, Calif., introduces Craic FilmPro film thickness measurement software.
News, Magazine & Media / Industry News
DCG Systems Meridian probe enables full wafer diagnostic and testing under production conditions
Published: October 19, 2014
DCG Systems Inc., Fremont, Calif., announces the first installation of the Meridian WS-DP (WaferScan Direct Probe) at Nvidia, a leading manufacturer of graphics processors for advanced visual computing.
News, Magazine & Media / Industry News
Element Six thermal grade of diamond offers full isotropic heat spreading
Published: October 19, 2014
Element Six, a member of the De Beers Group of companies, announces a new thermal grade of diamond grown by chemical vapor deposition, DiaFilm TM130.
News, Magazine & Media / Industry News
Nanotronics Imaging nSPEC 3D microscope captures nanoscale images
Published: October 19, 2014
Nanotronics Imaging, Cuyahoga Falls, Ohio, introduces its latest computer-controlled microscope, the nSPEC 3D, which combines high quality and imaging purity of optical lenses with advanced computer pattern-recognition algorithms and custom 3D printed hardware.
News, Magazine & Media / Industry News
Electron-beam melting builds nickel-base parts with precise microstructures
Published: October 19, 2014
Researchers at Oak Ridge National Laboratory, Oak Ridge, Tenn., have demonstrated that building parts by electron beam melting enables control of the microstructure and properties of metal components with high precision.
News, Magazine & Media / Industry News
ASM International partners with AQM to offer classes overseas
Published: October 02, 2014
Fall metallurgical class schedule available for new Italy location
News, Magazine & Media / Industry News
Two-dimensional phosphorus provides stable semiconductor properties
Published: September 22, 2014
Researchers at Rice University, Houston, Texas, report that semiconducting phosphorus sheets do not contain the rows of defects that reduce the electronic properties of other materials.
News, Magazine & Media / Industry News
Intel releases new high-density modular test platform
Published: September 22, 2014
Intel Corp., Santa Clara, Calif., has announced the availability of its revolutionary high-density modular test (HDMT) platform.
News, Magazine & Media / Industry News
Veeco IBD upgrade of Nexus lithography system produces no deposition defects greater than 70 nm
Published: September 22, 2014
Veeco Instruments Inc., Plainview, N.Y., reports that its new Odyssey ion beam deposition (IBD) upgrade for the NEXUS IBD-LDD system has repeatedly produced photomask blanks with zero deposition defects larger than 70 nanometers.
News, Magazine & Media / Industry News
Germanium-tin thin films deposited on silicon could build better infrared cameras
Published: September 22, 2014
Engineering researchers at the University of Arkansas in Fayetteville have developed an infrared detector made of thin films of GeSn semiconductor material deposited on a silicon substrate.
News, Magazine & Media / Industry News
