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1458 items found
FEI opens new technology center in the Czech Republic
Published: September 22, 2014
FEI Co., Hillsboro, Ore., announces the opening of a new technology center in the industrial estate of Cernovická Terasa, Brno, Czech Republic.
News, Magazine & Media / Industry News
Nordson DAGE Launches automated X-ray inspection system
Published: September 22, 2014
Nordson DAGE, Aylsworth, U.K., a division of Nordson Corp., announces the launch of its Xi3400 Automated X-ray Inspection System (AXI).
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A-STAR forms four semiconductor R&D labs with ten partners
Published: September 22, 2014
A-STAR, Singapore, announces that four joint laboratories, representing a commitment of $160 million between private and public sectors, were launched this summer between the Agency for Science, Technology and Research's (A*STAR's) Institute of Microelectronics, and its ten industry partners.
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Advantech and Penn State collaborate to simplify fabrication of complex electronic devices
Published: September 22, 2014
Advantech US Inc., Pittsburgh, reports that its engineers working with Penn State's Nanofabrication Laboratory have fabricated a prototype mask of silicon etched with the required micrometer-scale features.
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University of Bristol to install UHV photo electron emission microscopy system
Published: September 22, 2014
The University of Bristol, England, announces that an Ultra High Vacuum (UHV) Photo Electron Emission Microscopy (PEEM) system with state-of-the-art resolution for real-space and momentum-space imaging and spectroscopy will be installed at the University.
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EDFAS Board Election Results
Published: September 15, 2014
In August the Board nominated and elected officers for the September 2014 through August 2016 two-year term.
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EDFAS Board of Directors Election Results
Published: September 15, 2014
In August the Board nominated and elected officers for the September 2014 through August 2016 two-year term.
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FEI’s third-generation Helios DualBeam FIB/SEM adds workflow-specific configuration
Published: September 10, 2014
FEI Co., Hillsboro, Ore., has released the third generation of its Helios NanoLab DualBeam FIB/SEM microscope, which provides unmatched image contrast and resolution, while at the same time adding a new, easy-to-use user interface.
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JEOL’s new NMR spectrometers feature compact size, improved performance
Published: August 25, 2014
JEOL USA, Peabody, Mass., announces the JNM-ECZS series, a new line of next-generation NMR spectrometers that incorporate ultrahigh-accuracy RF circuitry based on the latest digital high-frequency technology.
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Mentor Graphics acquires XS Embedded for automotive system architectures
Published: August 25, 2014
Mentor Graphics Corp., Wilsonville, Ore., has acquired XS Embedded GmbH (XSe), a technology leader in the creation of automotive system architectures and hardware reference platforms.
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