Hitachi High-Tech micro-spot XRF analyzer now offered by Eastern Applied Research

Published: March 22, 2019

Eastern Applied Research, Buffalo, N.Y., recently named as an Authorized Distributor of Hitachi High-Tech Science Corp., now offers an XRF analyzer developed for ultrathin film measurements and micro-spot analysis needs: the Hitachi FT-150 series.

News, Magazine & Media / Industry News

Witec analysis tool enables Raman microscopes to identify and classify particles

Published: March 21, 2019

Witec GmbH, Germany, pioneer of Raman imaging and correlative microscopy, introduces ParticleScout, a particle analysis tool that enables researchers to find, classify, quantify, and identify particles quickly and easily with the Alpha300 Raman microscope series.

News, Magazine & Media / Industry News

Bruker wins IF Design awards for three different products

Published: March 21, 2019

Bruker, Munich, has been awarded the IF (International Forum) Design Award for three different products: the FT-IR spectrometers Invenio and Alpha II, as well as the FT-NIR spectrometer MPA II in the categories “Industry” and “Medicine/Health” of the discipline “Product Design.”

News, Magazine & Media / Industry News

Rigaku EDXRF instrument analyzes elements from Na through U in almost any matrix

Published: March 21, 2019

Rigaku, Japan, announces the newest addition to the NEX DE series, the Rigaku NEX DE VS direct excitation variable-spot EDXRF elemental analyzer, which is uniquely suited for small spot analysis applications.

News, Magazine & Media / Industry News

Keyence 3D Scanner CMM VL Series captures surface data and color information

Published: March 21, 2019

Keyence, Itasca, Ill., has launched its new VL Series of 3D Scanner CMM, which provides a structured light scanner with full 360 degree measurement and claims fully traceable measurements of ±10 ?m accuracy with 2 µm repeatability.

News, Magazine & Media / Industry News

Leica DM3 XL microscope features macro objective with 30% larger field, LED lighting

Published: March 21, 2019

Leica Microsystems, Buffalo Grove, Ill., introduces the Leica DM3 XL microscope system that includes a macro objective enabling a 30% increase in field of view and a wide choice of different stage inserts: metal inserts, wafer holders, and mask holders.

News, Magazine & Media / Industry News

DualBeam FIB-SEM microscope for semiconductors includes new feedback systems

Published: March 21, 2019

Thermo Fisher Scientific, Waltham, Mass., introduces its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization and analysis: the Thermo Scientific Helios 5 DualBeam microscope.

News, Magazine & Media / Industry News

Fujifilm Electronic Materials invests $91 million to expand manufacturing in Arizona

Published: March 11, 2019

Fujifilm Electronic Materials U.S.A., a subsidiary of Tokyo-based Fujifilm Holdings Corp., recently began a $91 million investment project focused on the company's manufacturing and development facilities in Mesa, Arizona.

News, Magazine & Media / Industry News

Asylum Research Jupiter AFM provides 200-mm sample access and higher resolution

Published: March 11, 2019

Oxford Instruments Asylum Research, Santa Barbara, Calif., announces the new Jupiter XR Atomic Force Microscope, the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.

News, Magazine & Media / Industry News

Mineral and organic acids extract rare earth elements from phosphate rock waste

Published: March 11, 2019

Researchers from Rutgers University-New Brunswick, N.J., and members of the Critical Materials Institute in Ames, Iowa, announce that they have found a possible new source of rare earth elements in phosphate rock waste, and have developed an environmentally friendly way to extract the elements.

News, Magazine & Media / Industry News