Ultratech introduces Superfast 4G+ in-line wafer inspection system

Published: November 13, 2015

Ultratech Inc., San Jose, Calif., introduces the Superfast 4G+ in-line 3D topography wafer inspection system featuring coherent gradient sensing technology that enables a single wafer inspection tool to measure patterned wafers across the entire fab line at the lowest cost.

News, Magazine & Media / Industry News

Ipsen furnace enables California Brazing to increase aluminum brazing capacity

Published: November 11, 2015

Ipsen USA, Cherry Valley, Ill., reports that California Brazing recently purchased its third vacuum aluminum brazing (VAB) furnace from Ipsen, to expand capacity and manufacture a variety of aluminum-brazed assemblies.

News, Magazine & Media / Industry News

Nomination deadline for the 2016 Class of Fellows is fast approaching

Published: November 05, 2015

The honor of Fellow of the Society was established to provide recognition to members for distinguished contributions in the field of materials science and engineering, and to develop a broadly based forum for technical and professional leaders to serve as advisors to the Society. The deadline for submission is November 30.

News, Magazine & Media / Industry News

ASM Handbooks Online now includes Volume 5B: Protective Organic Coatings

Published: October 29, 2015

ASM International, Materials Park, Ohio, recently released ASM Handbooks Online, which features the addition of ASM Handbook, Volume 5B: Protective Organic Coatings.

News, Magazine & Media / Industry News

Shimadzu high-speed video camera allows ten million frames per second

Published: October 19, 2015

Shimadzu Scientific Instruments, Japan, announces the release of its new Hyper Vision HPV-X2 high-speed video camera.

News, Magazine & Media / Industry News

Silicon drift detectors with silicon nitride entry window enable 35% higher sensitivity

Published: October 19, 2015

Edax Inc., Mahwah, N.J., introduces a new series of Octane Elite silicon drift detectors with silicon nitride entry windows that offer up to 35% better light-element sensitivity and outstanding low-energy performance.

News, Magazine & Media / Industry News

Silicon drift detectors with silicon nitride entry window enable fast energy dispersive spectroscopy

Published: October 19, 2015

Edax Inc., Mahwah, N.J., introduces a new series of Octane Elite silicon drift detectors, which offer up to 35% better light-element sensitivity and outstanding low-energy performance due to silicon nitride entry windows.

News, Magazine & Media / Industry News

Jeol introduces third-generation Neoscope SEM with upgraded functionality

Published: October 19, 2015

Jeol USA, Peabody, Mass., introduces the JSM-6000Plus, the third generation of the popular NeoScope benchtop SEM, which delivers fast, high magnification electron microscopy with more functionality than typical benchtop SEMs.

News, Magazine & Media / Industry News

Hitachi TEM is now compatible with imaging software from Advanced Microscopy Techniques

Published: October 19, 2015

Hitachi High Technologies America Inc., Clarksburg, Md., announces that Hitachi, the University of Colorado at Boulder, and the TEM camera manufacturer Advanced Microscopy Techniques (AMT) of Woburn, Mass., have collaborated to develop a convenient software package for state-of-the-art, single or dual-axis tomography acquisition and extended image montaging for the Hitachi HT7700 TEM.

News, Magazine & Media / Industry News

Rudolph acquires semiconductor inspection technology of Stella Alliance

Published: October 19, 2015

Rudolph Technologies Inc., Flanders, N.J., has purchased Stella Alliance LLC for its patented illumination, auto-focus, and image acquisition technology, which significantly enhances the ability to identify certain critical defects not visible with current techniques.

News, Magazine & Media / Industry News